What are the common standards for electronic material detection?

 GB / T 13387-2009 Method of silicon and other electronic materials

SJ 3195-1989 Test method for the work function of electronic materials

SJ 3196-1989 Test method for the secondary electron emission coefficient of electronic materials

SJ 3205-1989 Measurement of the evaporation rate of electronic materials

T / CSRA 3-2020 electronic material

SJ 3234-1989 Dynamic test method for the vacuum vent properties of electronic materials

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