What are the common standards for electronic material detection?
GB / T 13387-2009 Method of silicon and other electronic materials
SJ 3195-1989 Test method for the work function of electronic materials
SJ 3196-1989 Test method for the secondary electron emission coefficient of electronic materials
SJ 3205-1989 Measurement of the evaporation rate of electronic materials
T / CSRA 3-2020 electronic material
SJ 3234-1989 Dynamic test method for the vacuum vent properties of electronic materials
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